DocumentCode :
1331386
Title :
Semiconductor microlenses fabricated by one-step wet etching
Author :
Yu-Sik Kim ; Jaehoon Kim ; Joong-Seon Choe ; Young-Geun Rob ; Heonsu Jeon ; Woo, J.C.
Author_Institution :
Dept. of Phys., Seoul Nat. Univ., South Korea
Volume :
12
Issue :
5
fYear :
2000
fDate :
5/1/2000 12:00:00 AM
Firstpage :
507
Lastpage :
509
Abstract :
We fabricated refractive semiconductor microlenses using a diffusion-limited chemical etching technique based an Br2 solution. The simple one-step wet etching process produced high-quality microlenses of GaAs and InP, the two most popular compound semiconductor materials used in optoelectronics. A spherical GaAs microlens with a nominal lens diameter of 30 μm exhibited a radius of curvature and focal length of 91 and 36 μm, respectively. The surface roughness, examined by atomic force microscopy (AFM), was measured to be below /spl plusmn/10 /spl Aring/. This microlens fabrication method should be readily applicable due to the simplicity in processing and the high-quality results.
Keywords :
III-V semiconductors; etching; gallium arsenide; indium compounds; microlenses; optical fabrication; Br/sub 2/ solution; GaAs; InP; atomic force microscopy; diffusion-limited chemical etching; fabrication; focal length; one-step wet etching; radius of curvature; refractive semiconductor microlens; surface roughness; Atomic force microscopy; Atomic measurements; Chemicals; Force measurement; Gallium arsenide; Indium phosphide; Lenses; Microoptics; Semiconductor materials; Wet etching;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.841268
Filename :
841268
Link To Document :
بازگشت