DocumentCode
1331708
Title
Influence of the Stress Current on Spin-Torque-Oscillator With NCMR-SV Devices
Author
Nakamura, T. ; Doi, M. ; Hashimoto, Shuji ; Iwasaki, Hisao ; Sahashi, Masashi
Author_Institution
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
Volume
47
Issue
10
fYear
2011
Firstpage
3377
Lastpage
3379
Abstract
We investigated the microwave oscillations induced by spin transfer torque with a current-perpendicular-to-plane (CPP) nanocontacts spin-valve (NCSV) structure under dc current. First, we carefully studied the influence of the stress current, at which a synthetic-antiferromagnet (SAF)-spin-flop might take place with Joule heating under the applied field for measurement, on the SAF magnetization state for CPP-NCSV with high magnetoresistance (MR) ratio of approximately 20% to determine the applied current densities of the devices for microwave oscillation measurement, and then its microwave oscillation characteristics were clarified. The clear decrease in the MR ratio due to Joule heating was observed only in NCSV devices with high MR ratios. Therefore, the critical current density of the device for the microwave oscillation decreases with an increase in the MR ratio, which improves the oscillation efficiency. It suggests that the current is more effectively confined at NCs compared with the low MR devices. As a result, we succeeded in observing excellent oscillation characteristics, i.e., a large oscillation power of 64 nW and a narrow line width of 6.5 MHz at approximately 1.1 GHz in an NCSV device.
Keywords
antiferromagnetic materials; magnetisation; magnetoresistance; nanocontacts; oscillations; spin valves; CPP NCSV nanocontacts spin-valve structure; Joule heating; NCMR-SV devices; SAF magnetization state; critical current density; current-perpendicular-to-plane nanocontacts spin-valve structure; dc current; magnetoresistance ratio; microwave oscillations; oscillation efficiency; spin transfer torque; spin-torque-oscillator; stress current; synthetic-antiferromagnet-spin-flop; Magnetic domains; Magnetization; Magnetomechanical effects; Microwave devices; Microwave oscillators; Stress; High-temperature annealing; Joule heating; magnetic nanocontact magnetoresistance; magnetization dynamics; microwave oscillation; spin transfer torque (STT); synthetic antiferromagnet;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2011.2157107
Filename
6028105
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