• DocumentCode
    1331788
  • Title

    Oxidation and Annealing Process: Morphological Change and Nanocontact MR in Spin Valves With FeCo–AlO _{x} NOL Spacer

  • Author

    Shiokawa, Y. ; Shiota, M. ; Watanabe, Yoshihiro ; Otsuka, Takayuki ; Doi, M. ; Sahashi, Masashi

  • Author_Institution
    Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
  • Volume
    47
  • Issue
    10
  • fYear
    2011
  • Firstpage
    3470
  • Lastpage
    3473
  • Abstract
    We studied the formation mechanism of ferromagnetic nanocontacts (NCs) around 1-2 nm in diameter in thin AlOx nano-oxide layer (NOL) through in situ conductive atomic force microscopy (c-AFM), which is the only method suitable for measuring morphological changes in features this small. Spin valves (SVs) with Fe0.5Co0.5NCs in AlOx NOL fabricated by ion-assisted-oxidation (IAO) irradiated onto 1.3-nm-thick Al had nanocontact magnetoresistance (NCMR) characteristics with the MR ratio of 5% for 1 Ω μm2. According to measurements with c-AFM, these NCs were mostly located at the valleys between the AlOx grains or the edge of the grain. In other words, NCs were formed in the oxidation and cohesion process of Al by the IAO. Moreover, we found that the high-temperature annealing process improved the MR ratio to around 10% for 0.5 Ω μm2. The high-temperature annealing process may involve the AlOx morphological change and have led the Al atoms in NCs to migrate to AlOx by combining with oxygen as impurities. Then, the morphological changes and migration of Al caused NCs to be the low resistivity and the short length.
  • Keywords
    aluminium compounds; annealing; atomic force microscopy; cobalt alloys; ferromagnetic materials; high-temperature effects; iron alloys; magnetic multilayers; magnetic thin films; magnetoresistance; nanofabrication; nanomagnetics; nanostructured materials; oxidation; spin valves; Fe0.5Co0.5-AlOx; annealing; c-AFM; cohesion; conductive atomic force microscopy; ferromagnetic nanocontacts; high-temperature annealing; ion-assisted-oxidation; morphological change; nanocontact magnetoresistance; nanooxide layer; resistivity; spin valves; Annealing; Atomic force microscopy; Integrated circuit modeling; Iron; Oxidation; Conductive atomic force microscopy (c-AFM); magnetoresistance; morphological change; nanocontact (NC);
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2157110
  • Filename
    6028127