Title :
Effect of Exchange Stiffness on Efficiency of Shields of Magnetic Recording Heads
Author :
Suzuki, Yuya ; Uesaka, Y.
Author_Institution :
Dept. of Electr. & Electron. Eng., Nihon Univ., Koriyama, Japan
Abstract :
The effect of the exchange stiffness A on the behaviors of magnetic shields of magnetic recording heads was evaluated using a simplified model structure. The calculation is based on a micromagnetics model applied to basic excitation modes. It was found that the effect of exchange stiffness seriously degrades the efficiency of magnetic shields for short-wave excitation mode corresponding to bit size of 10 nm or less. The finite depth of the shield is not the limiting factor for the effectiveness of the shield, although it may affect a very long wavelength component.
Keywords :
exchange interactions (electron); magnetic heads; magnetic recording; magnetic shielding; micromagnetics; exchange stiffness; magnetic recording heads; magnetic shields; micromagnetics model; short-wave excitation mode; Anisotropic magnetoresistance; Magnetic heads; Magnetic noise; Magnetic shielding; Magnetization; Permeability; Exchange stiffness; magnetic recording; magnetic recording head; micromagnetics simulation;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2011.2154311
