Title : 
A Novel Error-Correcting System Based on Product Codes for Future Magnetic Recording Channels
         
        
            Author : 
Tam Van Vo ; Mita, Seiichi
         
        
            Author_Institution : 
Toyota Technol. Inst., Nagoya, Japan
         
        
        
        
        
        
        
            Abstract : 
We propose a novel construction of product codes for high-density magnetic recording based on binary low-density parity check (LDPC) codes and binary image of Reed-Solomon (RS) codes. Moreover, two novel algorithms are proposed to decode the codes in the presence of AWGN errors and scattered hard errors (SHEs). Simulation results show that at a bit-error rate (BER) of approximately 10-8 , our method allows improving the error performance by approximately 1.9 dB compared with that of a hard decision decoder of RS codes of the same length and code rate. For the mixed error channel, including random noise and SHEs, the signal-to-noise ratio is set at 5 dB, and 150 to 400 SHEs are randomly generated. The bit-error performance of the proposed product code shows a significant improvement over that of equivalent random LDPC codes or serial concatenation of LDPC and RS codes.
         
        
            Keywords : 
AWGN; Reed-Solomon codes; binary sequences; error statistics; magnetic recording; parity check codes; random noise; AWGN errors; LDPC codes; Reed-Solomon codes; binary low-density parity check codes; bit-error rate; error-correcting system; magnetic recording channels; product codes; random noise; scattered hard errors; Bit error rate; Decoding; Detection algorithms; Iterative decoding; Noise; Product codes; Binary image of RS codes; permutation decoding algorithm; product codes; projective geometry LDPC codes;
         
        
        
            Journal_Title : 
Magnetics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TMAG.2011.2157091