Title :
Scanning tunnelling optoelectronic microscope with 2 ps time resolution
Author :
Takeuchi, K. ; Mizuhara, A.
fDate :
8/29/1996 12:00:00 AM
Abstract :
The authors have developed a scanning tunnelling optoelectronic microscope (STOEM) and measured electric pulses with a 2.5 ps width corresponding to a time resolution better than 2 ps. This substantial improvement was realised using low temperature-grown GaAs (LT-GaAs) for the photoconductive semiconductor switch (PCSS) on the probe and by reducing the probe dimension
Keywords :
electric variables measurement; gallium arsenide; high-speed optical techniques; integrated circuit testing; photoconducting switches; probes; scanning tunnelling microscopy; semiconductor device testing; signal sampling; 2 ps; 2.5 ps; GaAs; low temperature-grown GaAs; photoconductive semiconductor switch; probe; scanning tunnelling optoelectronic microscope; time resolution; ultra-fast electrical signals; ultrafast measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19961162
