DocumentCode
1332092
Title
Electronic Properties and Orientation-Dependent Performance of InAs Nanowire Transistors
Author
Alam, Khairul ; Sajjad, Redwan N.
Author_Institution
Dept. of Electr. & Electron. Eng., East West Univ., Dhaka, Bangladesh
Volume
57
Issue
11
fYear
2010
Firstpage
2880
Lastpage
2885
Abstract
The electronic properties, namely, the band structures, the band gaps, and the electron effective masses of hydrogen-passivated InAs nanowires grown in 〈100〉 , 〈110〉, and 〈111〉 crystallographic directions are studied using sp3d5s* orbital-basis tight-binding model. We then parameterize the band gaps and electron effective masses to facilitate device simulation and to study the orientation-dependent performance of n-channel InAs nanowire transistors using a top-of-the-barrier model. The 〈111〉 and 〈110〉 wire transistors have better performance metrics. The quantum-confinement effect is largest in the 〈100〉 wire, which results in a higher band gap and a heavier effective mass for relatively smaller diameter wires. The consequence is lower current, higher density of states, higher quantum capacitance, and longer delay in the 〈100〉 wire transistors. The 〈110〉 and 〈111〉 wires have a very similar quantum-confinement effect, even for the smaller diameters, which results in similar band gaps, similar effective masses, and similar performance metrics.
Keywords
nanowires; semiconductor quantum wires; InAs; band gap; band structure; crystallographic direction; device simulation; electron effective mass; electronic property; hydrogen-passivated nanowire; nanowire transistor; orbital-basis tight-binding model; orientation-dependent performance; quantum capacitance; quantum-confinement effect; top-of-the-barrier model; Effective mass; Photonic band gap; Quantum capacitance; Transistors; Wire; InAs nanowire transistors; orientation dependent electronic properties; orientation dependent performance metrics; parametrization of effective mass and band gap;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2010.2066569
Filename
5582272
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