DocumentCode :
1332119
Title :
Distortion of ESD Generator Pulse Due to Limited Bandwidth of Verification Path
Author :
Baran, Janusz ; Sroka, Jan
Author_Institution :
Inst. of Electron. & Control Syst., Czestochowa Univ. of Technol., Czestochowa, Poland
Volume :
52
Issue :
4
fYear :
2010
Firstpage :
797
Lastpage :
803
Abstract :
The paper deals with analysis of how limited bandwidth of a setup for verification of electrostatic discharge (ESD) generators affects reliability of testing. It is investigated how suppression of a high-frequency part of an ESD pulse spectrum distorts the pulse waveform and affects its standardized time domain metrics: the rise time and the peak value. Restriction of a pulse spectrum is achieved by low-pass filtering with a defined passband. The filtering models high-frequency attenuation of a measurement path, in particular that of an oscilloscope. The analysis is conducted for theoretical ESD pulses, specified by the IEC Standard, as well as for series of real noisy pulses recorded on setups with wideband 6 and 12 GHz oscilloscopes. Discrepancies of rise times and peak currents of filtered pulses with respect to an original input pulse are calculated as measures of distortion due to constraint of a pulse spectrum. It is shown that above 3 GHz, the setup circuit noise is the main factor contributing to measurement uncertainty of the metrics.
Keywords :
IEC standards; band-pass filters; electrostatic discharge; low-pass filters; oscilloscopes; time-domain analysis; IEC standard; electrostatic discharge generator pulse distortion; electrostatic discharge verification; frequency 12 GHz; frequency 6 GHz; low-pass filtering; oscilloscope; passband; peak value; pulse spectrum; pulse waveform; rise time; testing reliability; time domain metrics; Bandwidth; Circuit noise; Electrostatic discharge; Frequency domain analysis; Uncertainty; Circuit noise; electrostatic discharges; frequency-domain analysis; uncertainty;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2010.2071386
Filename :
5582276
Link To Document :
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