Title :
Magnetic Properties and Giant Magnetoimpedance of FeNi-Based Nanostructured Multilayers With Variable Thickness of the Central Cu Lead
Author :
Volchkov, Stanislav O. ; Fernandez, Eduardo ; Garcia-Arribas, Alfredo ; Barandiaran, Jose Manuel ; Lepalovskij, Vladimir N. ; Kurlyandskaya, G.V.
Author_Institution :
Dept. of Magn. & Magnetics Nanomater., Ural Fed. Univ., Ekaterinburg, Russia
Abstract :
The magnetoimpedance effect is attractive for thin film-based magnetic sensor applications. Recently a significant progress has been made in the development of appropriate theories, preparation and characterization of MI thin film-based structures. In the present work FeNi(100 nm)/Cu(3.2 nm)]4/FeNi(100 nm)/Cu(LCu)/[FeNi(100 nm)/Cu(3.2 nm)]4/FeNi(100 nm) multilayered structures with open magnetic flux have been prepared by RF-sputtering. Their magnetic properties and MI were studied as a function of the thickness of the central Cu lead. It was shown that the thickness of the Cu lead is an important parameter. The highest sensitivity (≈ 50%/Oe, f=160 MHz) was observed for the sample with a central Cu layer thickness of about a half-thickness of a magnetic layer (LCu ≈ 250 nm). The maximum sensitivity of the real part of the impedance was also obtained for this thickness (≈ 75%/Oe).
Keywords :
copper; giant magnetoresistance; iron alloys; magnetic multilayers; nanomagnetics; nanostructured materials; nickel alloys; FeNi-Cu-FeNi-Cu-FeNi-Cu-FeNi; RF-sputtering; central copper lead; frequency 160 MHz; giant magnetoimpedance; magnetic flux; magnetic layer; magnetoimpedance effect; multilayered structures; nanostructured multilayers; size 3.2 nm to 100 nm; Copper; Magnetic hysteresis; Magnetic multilayers; Nonhomogeneous media; Perpendicular magnetic anisotropy; Sensitivity; Magnetization processes; magnetoimpedance; thin films;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2011.2157896