DocumentCode
1332246
Title
The generalized uniqueness wavelet descriptor for planar closed curves
Author
Hung, King-Chu
Author_Institution
Dept. of Electron. Eng., I-Shou Univ., Taiwan
Volume
9
Issue
5
fYear
2000
fDate
5/1/2000 12:00:00 AM
Firstpage
834
Lastpage
845
Abstract
In the problem of specifying a well-defined wavelet description of a planar closed curve, defining a unique start point on the curve is crucial for wavelet representation. In this paper, a generalized uniqueness property inherent in the one-dimensional (1-D) discrete periodized wavelet transformation (DPWT) is derived. The uniqueness property facilitates a quantitative analysis of the one-to-one mapping between the variation of 1-D DPWT coefficients and the starting point shift of the originally sampled curve data. By employing the uniqueness property, a new shape descriptor called the uniqueness wavelet descriptor (UWD) by which the starting point is fixed entirely within the context of the wavelet representation is proposed. The robustness of the UWD against input noise is analyzed. On the basis of local shape characteristic enhancement, several experiments were conducted to illustrate the adaptability property of the UWD for desirable starting point determination. Our experiments of pattern recognition show that the UWD can provide a supervised pattern classifier with optimal features to obtain the best matching performance in the presence of heavy noise. In addition, the generalized uniqueness property can be used for the shape regularity measurement. The UWD does not have local support and therefore it can not be applied to contour segments
Keywords
discrete wavelet transforms; image classification; image enhancement; image matching; image representation; image sampling; noise; pattern recognition; 1D DPWT coefficients; 1D discrete periodized wavelet transformation; experiments; generalized uniqueness property; generalized uniqueness wavelet descriptor; input noise; local shape characteristic enhancement; matching performance; noise; optimal features; pattern recognition; planar closed curves; sampled curve data; shape descriptor; shape regularity measurement; starting point shift; supervised pattern classifier; unique start point; uniqueness wavelet descriptor; wavelet representation; Application software; Computer graphics; Discrete wavelet transforms; Feature extraction; Noise robustness; Noise shaping; Pattern matching; Pattern recognition; Shape measurement; Wavelet transforms;
fLanguage
English
Journal_Title
Image Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7149
Type
jour
DOI
10.1109/83.841530
Filename
841530
Link To Document