• DocumentCode
    1332259
  • Title

    Computational Characterization of a Photonic Crystal Cantilever Sensor Using a Hexagonal Dual-Nanoring-Based Channel Drop Filter

  • Author

    Li, Bo ; Hsiao, Fu-Li ; Lee, Chengkuo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • Volume
    10
  • Issue
    4
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    789
  • Lastpage
    796
  • Abstract
    We investigated photonic crystal-based dual-nanoring (DNR) channel drop filters for nanomechanical sensor applications. The backward drop mechanism is explained by a proposed model. A resonant peak at 1553.6 nm with a quality factor better than 3800 is observed at the backward drop port. When this DNR is integrated at the junction between the silicon cantilever and the substrate, the deformation of the silicon cantilever can be detected in terms of the resonant wavelength and resonant wavelength shift. The derived minimum detectable force is 37 nN.
  • Keywords
    Q-factor; cantilevers; deformation; elemental semiconductors; nanophotonics; nanosensors; optical filters; optical resonators; optical sensors; photonic crystals; silicon; Si; backward drop mechanism; deformation; hexagonal dual nanoring channel drop filters; nanomechanical sensor; photonic crystal cantilever sensor; quality factor; resonant wavelength; resonant wavelength shift; Force; Lattices; Optical filters; Optical resonators; Resonator filters; Silicon; Strain; Filter; photonic crystal (PhC); resonator; sensor;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2010.2079942
  • Filename
    5582295