DocumentCode
1332378
Title
Time to Failure and Availability of Paralleled Systems with Repair
Author
Gaver, D.P., Jr.
Author_Institution
Department of Mathematics, Westinghouse Research Laboratories, Pittsburgh, Pa.; Advisory Mathematician, Westinghouse Electric Corporation, Research and Development Center, Pittsburgh, Pa.
Issue
2
fYear
1963
fDate
6/1/1963 12:00:00 AM
Firstpage
30
Lastpage
38
Abstract
This paper discusses reliability properties of some simple paralleled or redundant systems, where repair is possible in case of failure. We are assuming here that a ``failure´´ may always be instantly identified, and the appropriate steps taken. In certain problems such an assumption is not warranted. The ``systems´´ discussed are composed of two identical ``subsystems,´´ e.g., computers, or radars, and the system is considered to be in a state of failure when, and only when, both subsystems are simultaneously in such a state. Such system design strategies have been proposed for various applications, but have received little analysis. Two measures of reliability are discussed: 1) the time to system failure, measured from an instant at which both subsystems are operative, and 2) the long-run availability of the system, where the latter means the average fraction of the time during which the system is able to perform its function. Analysis is based on the assumption of ``random´´ (Poisson-like) failure for the subsystems (for theoretical justification see Drenick [2]), and independent but otherwise arbitrarily distributed repair times. It is of some interest that several of the important operational measures deduced, depend in detail upon the form of the distribution of repair times, as it is summarized in its Laplace transform, and not simply upon certain simple averages or moments of repair time.
Keywords
Availability; Failure analysis; Laplace equations; Particle measurements; Queueing analysis; Radar; Redundancy; Shape measurement; System analysis and design; Time measurement;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1963.5218202
Filename
5218202
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