• DocumentCode
    1332416
  • Title

    Silicon-on-Insulator In-Plane Gires–Tournois Interferometers

  • Author

    St-Gelais, Raphael ; Kerrien, Thomas ; Camirand, Hubert ; Poulin, Alexandre ; Peter, Yves-Alain

  • Author_Institution
    Department of Engineering Physics, Polytechnique Montréal, Montreal, Canada
  • Volume
    24
  • Issue
    24
  • fYear
    2012
  • Firstpage
    2272
  • Lastpage
    2275
  • Abstract
    Gires–Tournois interferometers (GTIs) based on deep-etched silicon-air Bragg mirrors and on optical quality dicing of silicon are reported. Broadband reflectivity of the deep-etched Bragg mirrors allows operation on a wavelength range exceeding the C Band window. The waveguided in-plane configuration of the devices allows interferometer lengths that are not typically achievable on chips using out-of-plane designs (e.g., L>1~{\\rm mm} for a 25-GHz free spectral range). Optical characterization of GTIs having two different free spectral ranges (i.e., 25 and 100 GHz) yield off-resonance insertion losses below 2 dB and polarization-dependant losses (PDL) below 1 dB. Insertion losses and PDL are, however, more important near the resonance wavelengths, reaching, respectively, 15 and 5 dB. Calculations show that the reported devices could be useful for Michelson-GTI bandpass filters, such as optical interleavers.
  • Keywords
    Integrated optics; Interferometers; Mirrors; Optical fiber dispersion; Optical waveguides; Reflectivity; Silicon on insulator technology; Integrated optics; interferometers; optical waveguides; silicon-on-insulator technology;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2012.2227142
  • Filename
    6352838