DocumentCode
1332499
Title
An Application of a Markovian Model to the Prediction of the Reliability of Electronic Circuits
Author
Tainiter, M.
Author_Institution
Johns Hopkins University, Baltimore, Md.
Issue
4
fYear
1963
Firstpage
15
Lastpage
25
Abstract
In this paper we describe how a model based on the theory of continuous-time Markov processes can be used to compute the reliability of electronic circuits, from data on the drift and failure of the individual components of the circuit. Specific examples of the method are given to show that useful results are obtained.
Keywords
Electronic circuits; Electronic components; Markov processes; Predictive models; Reliability theory;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1963.5218224
Filename
5218224
Link To Document