• DocumentCode
    1332585
  • Title

    Failure Time for a Redundant Repairable System of Two Dissimilar Elements

  • Author

    Gaver, D.P., Jr.

  • Author_Institution
    Carnegie Institute of Technology and Westinghouse Research Laboratories, Pittsburgh, Pa.
  • Issue
    1
  • fYear
    1964
  • fDate
    3/1/1964 12:00:00 AM
  • Firstpage
    14
  • Lastpage
    22
  • Abstract
    The distribution of time to failure for a system consisting of two dissimilar elements or subsystems operating redundantly and susceptible to repair is discussed. It is assumed that the times to failure for the two system elements are independent random variables from possibly different exponential distributions, and that the repair times peculiar to each element are independently distributed in an arbitrary fashion. For this basic model a derivation is given of the Laplace-Stieltjes transform of the distribution function of time to system failure, i.e, the time until both elements are simultaneously down for repair, measured from an instant at which both are operating. An explicit formula is given for the mean or expected time to system failure, a natural approximation to the latter is exhibited, and numerical comparisons indicate the quality of this approximation for various repair time distributions. In a second model the possibility of system failures due to overloading the remaining element after a single element failure is explicitly recognized. The assumptions made for the basic model are augmented by a stochastic process describing the random occurrence of overloads. Numerical examples are given. Finally, it is shown how the above models may be easily modified to account for delays in initiating repairs resulting from only occasional system surveillance, and to account for random catastrophic failures.
  • Keywords
    Application software; Computer applications; Concurrent computing; Conductors; Distributed computing; Exponential distribution; Military computing; Power system modeling; Random variables; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1964.5218240
  • Filename
    5218240