• DocumentCode
    1333049
  • Title

    MMIC LNAs for Radioastronomy Applications Using Advanced Industrial 70 nm Metamorphic Technology

  • Author

    Ciccognani, Walter ; Limiti, Ernesto ; Longhi, Patrick E. ; Renvoisè, Michel

  • Author_Institution
    Electron. Eng. Dept., Univ. di Roma Tor Vergata, Rome, Italy
  • Volume
    45
  • Issue
    10
  • fYear
    2010
  • Firstpage
    2008
  • Lastpage
    2015
  • Abstract
    Radioastronomy applications, as well as others, require ultra-low-noise front ends for high-sensitivity receivers. In this way, the image produced from a radio-telescope using such advanced components has a higher resolution and therefore allows scientists to obtain a clearer representation of the environment. The low-noise amplifier is the key component of a high sensitivity receiver (demonstrating a very low noise figure, even in the millimeter-wave frequency region). Such electrical performance is obtained from the combined use of an advanced technology (fT and fmax > 250 GHz, LG <; 0, 1 μm) and appropriate design methodologies that take into account electrical specifications and system constraints in the context of the targeted application. In this contribution, we will present both the performance of the employed technology (OMMIC 70 nm GaAs mHEMT) and the related low-noise design methodologies that have led to the realization of four different LNAs operating from 5 GHz up to 100 GHz and beyond.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MMIC amplifiers; gallium arsenide; low noise amplifiers; radioastronomy; radiotelescopes; GaAs; HEMT integrated circuits; MMIC amplifiers; frequency 5 GHz to 100 GHz; high-sensitivity receivers; low noise amplifiers; metamorphic technology; radioastronomy; radiotelescopes; size 70 nm; Design methodology; Gain; Impedance matching; Logic gates; Noise; Noise measurement; Temperature measurement; Amplifier noise; HEMT; HF FET amplifiers; millimeter-wave FET amplifiers; radioastronomy;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2010.2058170
  • Filename
    5584957