Title :
A built-in current sensor based on current-mode design
Author :
Lee, Kuen-Jong ; Tang, Jing-Jou
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
1/1/1998 12:00:00 AM
Abstract :
A very simple yet powerful design of a built-in current sensor for CMOS IDDQ testing is presented. Compared with previous methods, this design has lower sensitivity to parameter deviation caused by process or temperature variations. In addition, this design provides scalable sensing resolutions and programmable current reference. Experimental results show that a test response time of less than 2 ns can be acquired when the faulty IDDQ current is higher than 250 μA
Keywords :
CMOS integrated circuits; built-in self test; electric current measurement; electric sensing devices; integrated circuit testing; 2 ns; 250 muA; CMOS IDDQ testing; built-in current sensor; current-mode design; programmable current reference; scalable sensing resolutions; Automatic test equipment; Circuits; Delay; Design methodology; Differential amplifiers; Hardware; Logic testing; System testing; Temperature sensors; Voltage;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
