• DocumentCode
    1333106
  • Title

    A built-in current sensor based on current-mode design

  • Author

    Lee, Kuen-Jong ; Tang, Jing-Jou

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    45
  • Issue
    1
  • fYear
    1998
  • fDate
    1/1/1998 12:00:00 AM
  • Firstpage
    133
  • Lastpage
    137
  • Abstract
    A very simple yet powerful design of a built-in current sensor for CMOS IDDQ testing is presented. Compared with previous methods, this design has lower sensitivity to parameter deviation caused by process or temperature variations. In addition, this design provides scalable sensing resolutions and programmable current reference. Experimental results show that a test response time of less than 2 ns can be acquired when the faulty IDDQ current is higher than 250 μA
  • Keywords
    CMOS integrated circuits; built-in self test; electric current measurement; electric sensing devices; integrated circuit testing; 2 ns; 250 muA; CMOS IDDQ testing; built-in current sensor; current-mode design; programmable current reference; scalable sensing resolutions; Automatic test equipment; Circuits; Delay; Design methodology; Differential amplifiers; Hardware; Logic testing; System testing; Temperature sensors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.659464
  • Filename
    659464
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1333106