Title :
Optimal policies for the “yield learning” problem in manufacturing systems
Author :
Cassandras, Christos G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
fDate :
8/1/1996 12:00:00 AM
Abstract :
The yield learning problem encountered in many manufacturing systems involves controlling the production rate of a process so as to maximize cumulative rewards over some time interval. Because yield improvement occurs as a result of discrete events coinciding with lot processing completions, a basic tradeoff arises as high production rates increase rewards for a given yield but also cause longer average lot lead times which delay the events that trigger yield improvement. We show that in some cases simple bang-bang solutions can be obtained for this problem through standard optimal control techniques
Keywords :
bang-bang control; optimal control; optimisation; production control; average lot lead times; bang-bang solutions; cumulative rewards; discrete events; lot processing completions; manufacturing systems; optimal policies; production rate control; standard optimal control techniques; yield learning; Constraint optimization; Control systems; Delay; Manufacturing processes; Manufacturing systems; Optimal control; Production planning; Production systems; Queueing analysis; Throughput;
Journal_Title :
Automatic Control, IEEE Transactions on