Title :
Inline Pseudoelliptic
-Mode Dielectric Resonator Filters Using Multiple Evanescent Modes to Selectively Bypass Orthogonal Resonators
Author :
Bastioli, Simone ; Snyder, Richard V.
Author_Institution :
RS Microwave Co. Inc., Butler, NJ, USA
Abstract :
A new class of dielectric resonator filters with in-line structure and pseudoelliptic response is presented in this paper. The basic idea consists of using TE01δ single-mode resonators cascaded along an evanescent mode waveguide and oriented along orthogonal directions. By exploiting multiple evanescent modes, which can alternatively excite or bypass a resonator depending on its orientation, cross-coupling between nonadjacent dielectric pucks can be established and controlled. Various configurations, such as triplets, quadruplets, and quintuplets, can be obtained by properly orienting the various pucks and by exploiting a prescribed set of evanescent modes. In contrast with conventional techniques, pseudoelliptic filters can be implemented without using cumbersome cross-coupled architectures or reduced spurious performance multimode resonators. The experimental results of two sixth-order filters with two arbitrarily located transmission zeros, and a fifth-order filter with three transmission zeros validate the proposed filter class.
Keywords :
dielectric materials; dielectric resonator filters; elliptic filters; waveguide filters; TE01δ single-mode resonator; cross-coupled architecture; evanescent mode waveguide; fifth-order filter; in-line structure; inline pseudoelliptic TE01δ-mode dielectric resonator filter; multimode resonator; nonadjacent dielectric puck; orthogonal direction; orthogonal resonator; pseudoelliptic filter; pseudoelliptic response; sixth-order filter; transmission zero; Cavity resonators; Couplings; Dielectrics; Electromagnetic waveguides; Filtering theory; Resonant frequency; Topology; Bandpass filters; dielectric resonators; elliptic filters; rectangular waveguide; transmission zeros (TZs);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2012.2222659