DocumentCode :
1333933
Title :
Thermomechanical analysis in electronic packaging with unified constitutive model for materials and joints
Author :
Desai, Chandra S. ; Basaran, Camalettin ; Dishongh, Terrance ; Prince, John L.
Author_Institution :
Arizona Univ., Tucson, AZ, USA
Volume :
21
Issue :
1
fYear :
1998
fDate :
2/1/1998 12:00:00 AM
Firstpage :
87
Lastpage :
97
Abstract :
A unified constitutive modeling approach based on the disturbed state concept (DSC) provides improved characterization of thermomechanical response of joining (solders), ceramics and printed wire board (PWB) materials in electronic packaging. Various versions in the DSC approach are calibrated and validated with respect to laboratory test data, and are implemented in a nonlinear finite element (FE) procedure. The hierarchical nature of this procedure permits the user to choose a constitutive model, simple (elastic) to sophisticated (elastovisco-plastic with disturbance), depending upon the material and need. The FE is used to analyze thermomechanical behavior of two typical problems: (1) leadless ceramic chip carrier (LCCC) package; (2) solder ball connect (SBC) package. The FE results under cyclic thermal loading are compared with experimental data for the two packages, and with a previous FE analysis for the SBC package. In conjunction with the idea of critical disturbance at which thermal fatigue failure can occur, the analyzes allow identification of cycles to failure, Nf, and evaluation of reliability of the package. In the case of the SBC package, the analysis permits an evaluation of ball spacing on the thermomechanical behavior. The DSC approach can provide an integrated and improved procedure compared to available models for elastic, plastic, creep strains, and microcracking leading to degradation of strength and fatigue failure for a wide range of problems in electronic packaging under thermomechanical loading
Keywords :
fatigue; finite element analysis; packaging; soldering; calibration; chip-substrate system; disturbed state concept; electronic packaging; joint; leadless ceramic chip carrier package; nonlinear finite element method; printed wire board material; reliability; solder ball connect package; thermal fatigue failure; thermomechanical analysis; unified constitutive model; validation; Ceramics; Electronic packaging thermal management; Electronics packaging; Fatigue; Joining materials; Laboratories; Lead; Testing; Thermomechanical processes; Wire;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.659511
Filename :
659511
Link To Document :
بازگشت