Title :
Ray analysis of electromagnetic field build-up and quality factor of electrically large shielded enclosures
Author :
Kwon, Do-Hoon ; Burkholder, Robert J. ; Pathak, Prabhakar H.
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
fDate :
2/1/1998 12:00:00 AM
Abstract :
A high-frequency asymptotic ray solution is investigated for predicting the electromagnetic field build up and steady-state parameters of shielded enclosures or cavities, which are large with respect to wavelength. It is found that the ray solution can deterministically predict the early-time field build up after the source is switched on, but cannot predict the steady-state fields of high-Q enclosures because of the intractably large number of ray reflections required for convergence. However, it is demonstrated that the steady-state Q factor may be predicted from the early-time energy density build up at a point by coherently summing the power in each ray. The Q factor is obtained via its relationship to the cavity time constant, which may be extracted from the early time energy density curve. A clear indication of polarization diversity throughout the enclosure may also be obtained by plotting the polarization components of the early-time fields and energy density build up at different points. The advantage of the ray method is that it can be used to treat large closed cavities of relatively arbitrary shape
Keywords :
Q-factor; electromagnetic fields; electromagnetic shielding; electromagnetic wave polarisation; electromagnetic wave reflection; ray tracing; Q factor; cavity time constant; early-time field; electrically large shielded enclosures; electromagnetic field build-up; energy density; high-Q enclosures; high-frequency asymptotic ray solution; polarization diversity; quality factor; ray reflections; shielded cavities; steady-state parameters; Aerospace electronics; Electromagnetic analysis; Electromagnetic fields; Geometry; Polarization; Q factor; Reverberation chamber; Shape; Steady-state; Testing;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on