• DocumentCode
    1334288
  • Title

    Theoretical and Experimental Study of a Semiconductor Resonant Cavity Linear Interferometric Intensity Modulator

  • Author

    Hoghooghi, Nazanin ; Delfyett, Peter J.

  • Author_Institution
    CREOL, Univ. of Central Florida, Orlando, FL, USA
  • Volume
    29
  • Issue
    22
  • fYear
    2011
  • Firstpage
    3421
  • Lastpage
    3427
  • Abstract
    The phase response of an injection locked semiconductor laser that is used as the phase modulator in a resonant cavity linear interferometric intensity modulator is studied in detail. It is shown that, signal-to-intermodulation ratio of such a modulator is affected by the injection ratio, linewidth enhancement factor of the semiconductor laser, residual amplitude modulation, depth of phase modulation, and linearity of the resonant cavity response. Experimental measurements of the signal-to-intermodulation ratio of this modulator using a semiconductor Fabry-Pérot laser as the resonant cavity are in good agreement with the theoretically predicted values.
  • Keywords
    Fabry-Perot resonators; amplitude modulation; intensity modulation; laser cavity resonators; phase modulation; semiconductor lasers; injection locked semiconductor laser; injection ratio; linear interferometric intensity modulator; linewidth enhancement factor; phase modulator; phase response; residual amplitude modulation; semiconductor Fabry-Perot laser; semiconductor resonant cavity; signal-to-intermodulation ratio; Cavity resonators; Frequency modulation; Phase modulation; Resonant frequency; Semiconductor lasers; Signal to noise ratio; Injection locked lasers; modulators; semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2011.2169771
  • Filename
    6029405