DocumentCode :
1334288
Title :
Theoretical and Experimental Study of a Semiconductor Resonant Cavity Linear Interferometric Intensity Modulator
Author :
Hoghooghi, Nazanin ; Delfyett, Peter J.
Author_Institution :
CREOL, Univ. of Central Florida, Orlando, FL, USA
Volume :
29
Issue :
22
fYear :
2011
Firstpage :
3421
Lastpage :
3427
Abstract :
The phase response of an injection locked semiconductor laser that is used as the phase modulator in a resonant cavity linear interferometric intensity modulator is studied in detail. It is shown that, signal-to-intermodulation ratio of such a modulator is affected by the injection ratio, linewidth enhancement factor of the semiconductor laser, residual amplitude modulation, depth of phase modulation, and linearity of the resonant cavity response. Experimental measurements of the signal-to-intermodulation ratio of this modulator using a semiconductor Fabry-Pérot laser as the resonant cavity are in good agreement with the theoretically predicted values.
Keywords :
Fabry-Perot resonators; amplitude modulation; intensity modulation; laser cavity resonators; phase modulation; semiconductor lasers; injection locked semiconductor laser; injection ratio; linear interferometric intensity modulator; linewidth enhancement factor; phase modulator; phase response; residual amplitude modulation; semiconductor Fabry-Perot laser; semiconductor resonant cavity; signal-to-intermodulation ratio; Cavity resonators; Frequency modulation; Phase modulation; Resonant frequency; Semiconductor lasers; Signal to noise ratio; Injection locked lasers; modulators; semiconductor lasers;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2011.2169771
Filename :
6029405
Link To Document :
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