DocumentCode :
1334295
Title :
Process induced residual stresses in isotropically conductive adhesive joints
Author :
Wu, Sean X. ; Yuhai Mel ; Yeh, Chao-pin ; Wyatt, Karl W.
Author_Institution :
Corp. Software Center, Motorola Inc., Schaumburg, IL, USA
Volume :
19
Issue :
4
fYear :
1996
fDate :
10/1/1996 12:00:00 AM
Firstpage :
251
Lastpage :
256
Abstract :
Mechanical and thermomechanical tests were conducted to characterize conductive adhesives in terms of dimensional stability and viscoelastic properties. Dynamic testing results were converted from the frequency domain into the time domain. Those results were then incorporated into the ABAQUS finite element (FE) code, in which a finite element analysis (FEA) was conducted to investigate the stress development and stress relaxation process in the conductive adhesive joints by taking into account the viscoelastic properties of the conductive adhesive. Experimental results showed that the stresses in the conductive adhesive can relax significantly at elevated temperatures. Based on the experimental data and FEA result, a new cure schedule is proposed for the conductive adhesive studied
Keywords :
adhesion; conducting materials; finite element analysis; internal stresses; stress relaxation; viscoelasticity; ABAQUS code; curing; dimensional stability; dynamic testing; finite element analysis; isotropically conductive adhesive joint; mechanical testing; residual stress; stress relaxation; thermomechanical testing; viscoelastic properties; Conductive adhesives; Elasticity; Finite element methods; Frequency domain analysis; Mechanical factors; Residual stresses; Testing; Thermal stability; Thermomechanical processes; Viscosity;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part C, IEEE Transactions on
Publisher :
ieee
ISSN :
1083-4400
Type :
jour
DOI :
10.1109/3476.558551
Filename :
558551
Link To Document :
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