DocumentCode
1334733
Title
Analysis of viscous losses in the chemical interface layer of Love wave sensors
Author
Jakoby, Bernhard ; Vellekoop, Michael J.
Author_Institution
Lab. of Electron. Instrum./DIMES, Delft Univ. of Technol., Netherlands
Volume
47
Issue
3
fYear
2000
fDate
5/1/2000 12:00:00 AM
Firstpage
696
Lastpage
700
Abstract
Love waves have been introduced as highly effective devices for liquid-sensing applications. For chemical sensors, a microacoustic delay line featuring a multilayered waveguide supporting a generalised Love wave mode can be used in an oscillator setup. The top layer of the waveguide is a chemical interface, which selectively adsorbs certain target molecules in the adjacent liquid. The increase in mass density caused by adsorption can be detected as changes in the oscillation frequency. Commonly used interface materials show viscoelastic losses leading to an unwanted damping of the wave. To keep the signal-to-noise ratio high, the total insertion loss of the delay line should be kept as low as possible. Furthermore, it must not exceed a certain value to allow the electronic circuitry to sustain the oscillation. We analyzed the viscoelastic losses, which strongly depend on the frequency being used. By means of the proposed theoretical approach, the maximum thickness of the interface layer can be determined not to exceed the losses that can be handled by the driving electronics.
Keywords
Love waves; chemical sensors; surface acoustic wave delay lines; surface acoustic wave sensors; surface acoustic wave waveguides; Love wave sensor; adsorption; chemical interface layer; chemical sensor; damping; insertion loss; liquid sensing device; mass density; microacoustic delay line; multilayered waveguide; oscillator; signal-to-noise ratio; viscous loss; Chemical analysis; Chemical sensors; Damping; Delay lines; Elasticity; Frequency; Liquid waveguides; Oscillators; Signal to noise ratio; Viscosity;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.842058
Filename
842058
Link To Document