• DocumentCode
    1335155
  • Title

    A Unified Theory for S -Parameter Uncertainty Evaluation

  • Author

    Garelli, Marco ; Ferrero, Andrea

  • Author_Institution
    HFE (High Freq. Eng. Sagl), San Vittore, Switzerland
  • Volume
    60
  • Issue
    12
  • fYear
    2012
  • Firstpage
    3844
  • Lastpage
    3855
  • Abstract
    An analytical approach to compute the uncertainty of multiport scattering parameter measurements is presented. First, the various uncertainty causes from the noise to the standard definitions are modeled and characterized, then the uncertainty propagation up to the device-under-test measurement is computed. Experiments confirm the validity of this general approach.
  • Keywords
    S-parameters; electromagnetic wave scattering; integrated circuit noise; integrated circuit testing; multiport networks; S-parameter uncertainty evaluation; device-under-test measurement; multiport scattering parameter measurement; noise; uncertainty propagation; Calibration; Mathematical model; Measurement uncertainty; Noise measurement; Uncertainty; Multiport network analyzer; uncertainty; vector network analyzer (VNA) calibration;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2012.2221733
  • Filename
    6353610
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1335155