DocumentCode :
1335155
Title :
A Unified Theory for 
-Parameter Uncertainty Evaluation
Author :
Garelli, Marco ; Ferrero, Andrea
Author_Institution :
HFE (High Freq. Eng. Sagl), San Vittore, Switzerland
Volume :
60
Issue :
12
fYear :
2012
Firstpage :
3844
Lastpage :
3855
Abstract :
An analytical approach to compute the uncertainty of multiport scattering parameter measurements is presented. First, the various uncertainty causes from the noise to the standard definitions are modeled and characterized, then the uncertainty propagation up to the device-under-test measurement is computed. Experiments confirm the validity of this general approach.
Keywords :
S-parameters; electromagnetic wave scattering; integrated circuit noise; integrated circuit testing; multiport networks; S-parameter uncertainty evaluation; device-under-test measurement; multiport scattering parameter measurement; noise; uncertainty propagation; Calibration; Mathematical model; Measurement uncertainty; Noise measurement; Uncertainty; Multiport network analyzer; uncertainty; vector network analyzer (VNA) calibration;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2012.2221733
Filename :
6353610
Link To Document :
