Title :
Smart Trend-Traversal Protocol for RFID Tag Arbitration
Author :
Pan, Lei ; Wu, Hongyi
Author_Institution :
Qualcomm, San Jose, CA, USA
fDate :
11/1/2011 12:00:00 AM
Abstract :
A self-learning Smart Trend-Traversal (STT) protocol for tag arbitration is proposed in this work, which effectively reduces the collision overhead occurred in large-scale RFID systems. The protocol dynamically issues queries according to the adaptively learned tag density and distribution; and therefore, it significantly reduces delay and energy consumption. The optimality of STT does not rely on any presumed network conditions, which is in sharp contrast to other available schemes and renders it a highly desirable and practical solution.
Keywords :
protocols; radiofrequency identification; RFID tag arbitration; collision overhead; energy consumption; large-scale RFID systems; self-learning STT protocol; self-learning smart trend-traversal protocol; Delays; Energy consumption; Protocols; Radiofrequency identification; Signal processing algorithms; RFID tag arbitration; anti-collision; query-tree;
Journal_Title :
Wireless Communications, IEEE Transactions on
DOI :
10.1109/TWC.2011.091911.100484