• DocumentCode
    1335592
  • Title

    Measurement of Surface Plasmon Polariton Enhanced Goos–Hanchen Shift Based on Grating and Liquid Crystal Technologies

  • Author

    Huang, Zhang-Di ; Li, Su-Shan ; Wu, Zi-jian ; Xu, Fei ; Hu, Wei ; Lu, Yan-qing

  • Author_Institution
    Nat. Lab. of Solid State Microstructures, Nanjing Univ., Nanjing, China
  • Volume
    23
  • Issue
    23
  • fYear
    2011
  • Firstpage
    1829
  • Lastpage
    1831
  • Abstract
    We measured the surface plasmon polariton (SPP) enhanced Goos-Hanchen (GH) shift based on liquid crystal (LC) and grating technologies. An optical setup is used to convert the spatial displacement to incidence angle variation to a Littrow mounted diffraction grating. As a consequence, the GH shift information could be obtained from the back-reflected center wavelength that fulfills the Littrow condition. An LC cell is used to adjust the polarization state of the incident light without mechanical movement. About 10- μm GH shift difference between transverse-electric (TE) and transverse-magnetic (TM) mode lights were measured associated with the SPP excitation. The corresponding center wavelength shift of the returned beam is 404 pm. The relationship between energy conversion and GH shift is also investigated.
  • Keywords
    diffraction gratings; light polarisation; liquid crystal devices; optical variables measurement; polaritons; reflectivity; surface plasmons; Littrow mounted diffraction grating; back-reflected center wavelength; energy conversion; enhanced Goos-Hanchen shift; incidence angle variation; liquid crystal cells; polarisation state; spatial displacement; surface plasmon polariton excitation; transverse-electric mode; transverse-magnetic mode; Diffraction gratings; Gratings; Optical polarization; Optical reflection; Optical sensors; Optical surface waves; Plasmons; Goos–Hanchen (GH) shift; liquid crystal (LC); surface plasmon polariton (SPP);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2011.2170059
  • Filename
    6030919