• DocumentCode
    1335890
  • Title

    A Mostly-Digital Variable-Rate Continuous-Time Delta-Sigma Modulator ADC

  • Author

    Taylor, Gerry ; Galton, Ian

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, La Jolla, CA, USA
  • Volume
    45
  • Issue
    12
  • fYear
    2010
  • Firstpage
    2634
  • Lastpage
    2646
  • Abstract
    This paper presents a reconfigurable continuous-time delta-sigma modulator for analog-to-digital conversion that consists mostly of digital circuitry. It is a voltage-controlled ring oscillator based design with new digital background calibration and self-cancelling dither techniques applied to enhance performance. Unlike conventional delta-sigma modulators, it does not contain analog integrators, feedback DACs, comparators, or reference voltages, and does not require a low-jitter clock. Therefore, it uses less area than comparable conventional delta-sigma modulators, and the architecture is well-suited to IC processes optimized for fast digital circuitry. The prototype IC is implemented in 65 nm LP CMOS technology with power dissipation, output sample-rate, bandwidth, and peak SNDR ranges of 8-17 mW, 0.5-1.15 GHz, 3.9-18 MHz, and 67-78 dB, respectively, and an active area of 0.07.
  • Keywords
    CMOS digital integrated circuits; analogue-digital conversion; calibration; continuous time systems; delta-sigma modulation; voltage-controlled oscillators; ADC; LP CMOS technology; analog-to-digital conversion; digital background calibration; digital circuitry; power dissipation; prototype IC; reconfigurable continuous-time delta-sigma modulator; self-cancelling dither technique; size 65 nm; variable-rate continuous-time delta-sigma modulator; voltage-controlled ring oscillator; Analog-digital conversion; Continuous time systems; Delta-sigma modulation; Voltage-controlled oscillators; Continuous-time delta-sigma modulator; VCO ADC; delta-sigma ADC;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2010.2073193
  • Filename
    5585832