Investigation of Waveguide Mode Profiles of AWGs Using a Low-Coherence Interferometric Method

Author

Zhipeng Wang ; Yung-Jui Chen

Author_Institution

Dept. of Comput. Sci. & Electr. Eng., Univ. of Maryland, Baltimore, MD, USA

Volume

28

Issue

1

fYear

2010

Firstpage

131

Lastpage

140

Abstract

In this paper, we propose and demonstrate a novel method to characterize waveguide mode profiles in arrayed waveguide grating (AWG) devices by utilizing a low-coherence interferometric measurement. Our method calculates the waveguide mode profile from its far-field diffraction pattern obtained by the low-coherence interferometric measurement utilizing AWG as a testing vehicle. The waveguide mode profile and its far-field diffraction pattern follow the Fourier transformation relationship. Detailed formulation and analysis procedures are presented in this paper. Experimental results of waveguide mode profiles for Gaussian waveguides and multimode interference waveguides are also shown. This method is very effective in characterizing complex waveguide designs in advanced AWG devices.

Keywords

Fourier transforms; Gaussian processes; arrayed waveguide gratings; light interferometry; Fourier transformation relationship; Gaussian waveguides; arrayed waveguide grating devices; far-field diffraction pattern; low-coherence interferometric measurement; multimode interference waveguides; waveguide mode profiles; Arrayed waveguide gratings; Interference; Optical diffraction; Optical filters; Optical interferometry; Optical ring resonators; Optical waveguides; Passband; Testing; Wavelength division multiplexing; Diffraction gratings; integrated optics devices; planar waveguides;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/JLT.2009.2036140

Filename

5337982