• DocumentCode
    1336294
  • Title

    System complexity and integrated diagnostics

  • Author

    Simpson, William R. ; Sheppard, John W.

  • Author_Institution
    Arinc Res. Corp., Annapolis, MD, USA
  • Volume
    8
  • Issue
    3
  • fYear
    1991
  • Firstpage
    16
  • Lastpage
    30
  • Abstract
    An overview of a complete approach to integrated diagnostics is given. The approach is centered around an information-flow model and incorporates techniques from information fusion and artificial intelligence to guide analyses. The concept of integrated diagnosis is explained, and the model is examined. The authors show how to analyze testability, evaluate fault diagnosis, and create maintenance aids.<>
  • Keywords
    artificial intelligence; computer maintenance; computer testing; fault location; artificial intelligence; fault diagnosis; information fusion; information-flow model; integrated diagnostics; maintenance aids; system complexity; testability; Airplanes; Automatic testing; Failure analysis; Fault diagnosis; Fault tolerant systems; Government; Life testing; Manufacturing processes; NP-complete problem; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.84239
  • Filename
    84239
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1336294