Title :
Experimental Validations of a Simple PCB Interconnect Model for High-Rate Signal Integrity
Author :
Eudes, Thomas ; Ravelo, Blaise ; Louis, Anne
Author_Institution :
Grad. Sch. of Eng. ESIGELEC, IRSEEM (Res. Inst. on Electron. & Embedded Syst.), St. Etienne du Rouvray, France
fDate :
4/1/2012 12:00:00 AM
Abstract :
This paper is devoted to investigating experimental validations of a simple modeling method of PCB interconnects for high-speed signal integrity and electromagnetic compatibility applications. Based on the theoretical approach using the extraction method of the interconnect per-unit-length RLCG parameters, the reduced models of the corresponding transfer function, -parameters, and access and transfer impedances are also established. The methodology describing the different steps of the technique proposed for practical use cases in ultra wideband is established. To verify the effectiveness of the concept under consideration, time-domain validations from the frequency-measured data are realized by using printed circuit board microstrip interconnect lines with micrometers width and millimeters long. Therefore, the model was first validated experimentally, and with electromagnetic simulations, in frequency domain via comparison of -parameters and -matrix from dc to some gigahertz. It was found that relative errors lower than 1 dB were evaluated between the insertion loss of the models, simulations, and measurements. Then, by injecting noisy digital- and mixed-signals with 1 Gigasymbol/s, relative errors of lower than 1% were evaluated by considering the time-domain responses. Compared to the existing interconnect modeling tools, the developed one presents a high accuracy, simplicity, and very less computation time.
Keywords :
S-parameters; electromagnetic compatibility; frequency-domain analysis; microstrip lines; printed circuit interconnections; transfer functions; PCB interconnect model; RLCG parameters; S-parameters; electromagnetic compatibility; frequency-measured data; high-rate signal integrity; high-speed signal integrity; printed circuit board microstrip interconnect lines; transfer impedances; ultra wideband; Computational modeling; Integrated circuit interconnections; Integrated circuit modeling; Mathematical model; Scattering parameters; Time domain analysis; Transmission line matrix methods; ABCD-matrix reduced model; high-rate application; printed circuit board (PCB) interconnect; signal integrity (SI); time-domain measurement;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2011.2165216