Title :
Implicit Polynomial Representation Through a Fast Fitting Error Estimation
Author :
Rouhani, Mohammad ; Sappa, Angel Domingo
Author_Institution :
Comput. Vision Center, Univ. Autonoma de Barcelona Campus, Barcelona, Spain
fDate :
4/1/2012 12:00:00 AM
Abstract :
This paper presents a simple distance estimation for implicit polynomial fitting. It is computed as the height of a simplex built between the point and the surface (i.e., a triangle in 2-D or a tetrahedron in 3-D), which is used as a coarse but reliable estimation of the orthogonal distance. The proposed distance can be described as a function of the coefficients of the implicit polynomial. Moreover, it is differentiable and has a smooth behavior . Hence, it can be used in any gradient-based optimization. In this paper, its use in a Levenberg-Marquardt framework is shown, which is particularly devoted for nonlinear least squares problems. The proposed estimation is a generalization of the gradient-based distance estimation, which is widely used in the literature. Experimental results, both in 2-D and 3-D data sets, are provided. Comparisons with state-of-the-art techniques are presented, showing the advantages of the proposed approach.
Keywords :
curve fitting; gradient methods; least squares approximations; optimisation; polynomial approximation; signal processing; Levenberg-Marquardt framework; fast fitting error estimation; gradient based optimization; implicit polynomial fitting; implicit polynomial representation; nonlinear least squares problem; orthogonal distance estimation; Estimation; Mathematical model; Minimization; Optimization; Polynomials; Three dimensional displays; Curve/surface fitting; geometric distance estimation; implicit polynomial (IP); residual error minimization; Algorithms; Artifacts; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Numerical Analysis, Computer-Assisted; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
Journal_Title :
Image Processing, IEEE Transactions on
DOI :
10.1109/TIP.2011.2170080