DocumentCode
1336849
Title
Angular spectral approach to reflection of focused beams with oblique incidence in spherical-planar-pair lenses
Author
Tsukahara, Yusuke ; Nakaso, Noritaka ; Ohira, Katsumi
Author_Institution
Toppan Printing Co. Ltd., Saitama, Japan
Volume
38
Issue
5
fYear
1991
Firstpage
468
Lastpage
480
Abstract
The characteristics of the output signal from spherical-planar-pair (SPP) lenses in the ultrasonic microspectrometer (UMSM) are described. The angular spectral approach is used to obtain the mathematical formula of the output signal. Although isotropic specimens are assumed, anisotropic materials can be treated as well with a small modification. A 2-D approximation is introduced to analyze the specular reflection, the Rayleigh critical angular phenomenon, and V(z) of the specular reflection. Numerical calculations are also performed for specimens with copper substrate, steel substrate, and layered structures, by numerically integrating the 2-D formulas of the output signal. It is found that a ray optical treatment is a good approximation of the wave propagation in the SPP lenses. The incident angular dependence of a reflection coefficient can be estimated by tilting the sensor unit.<>
Keywords
acoustic microscopy; acoustic signal processing; lenses; surface acoustic waves; ultrasonic equipment; ultrasonic reflection; 2D approximation; Cu substrate; Rayleigh critical angular phenomenon; SAW; SPP lenses; UMSM; angular dependence; angular spectral approach; anisotropic materials; isotropic specimens; layered structures; mathematical formula; numerical calculation; oblique incidence; reflection coefficient; sensor unit; specular reflection; spherical-planar-pair lenses; steel substrate; ultrasonic microspectrometer; wave propagation; Acoustic beams; Acoustic sensors; Focusing; Frequency; Lenses; Optical reflection; Optical surface waves; Surface acoustic waves; Surface waves; Ultrasonic transducers;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.84292
Filename
84292
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