• DocumentCode
    1337148
  • Title

    An Integrated Electrothermal Design Primer Using an SiGe HBT PA [Application Notes]

  • Author

    Heimlich, Michael ; Schwitter, Bryan ; Ritchie, Graeme ; Fiala, John ; Mahon, Simon

  • Author_Institution
    Macquarie Univ., Sydney, NSW, Australia
  • Volume
    13
  • Issue
    7
  • fYear
    2012
  • Firstpage
    70
  • Lastpage
    80
  • Abstract
    The integrated design flow that links simulation, layout, and electromagnetic (EM) analysis is the foundation for modern RF/microwave integrated circuit (IC) design. The inclusion of thermal simulation in this flow is now possible with modern thermal solvers linked into RF/microwave integrated design tools. Silicon germanium (SiGe) heterojunction bipolar transistor (HBT) power amplifier (PA) design is used as an example where such a flow is most beneficial due to numerous issues such as array sizing and thermal runaway. An electrothermal flow is discussed relative to some overall metrics for design flows and that incorporates the availability of an integrated thermal solver into the earliest parts of, and potentially throughout, the entire design flow. The result is a flow that potentially reduces iterations during the design process and boosts design performance by freeing up margin.
  • Keywords
    bipolar integrated circuits; heterojunction bipolar transistors; integrated circuit layout; integrated circuit modelling; integrated circuit packaging; microwave integrated circuits; microwave power amplifiers; thermal analysis; thermal management (packaging); RF integrated circuit design; SiGe; array sizing; electromagnetic analysis; electrothermal flow; heterojunction bipolar transistor power amplifier; integrated circuit layout; integrated circuit simulation; integrated electrothermal design primer; microwave integrated circuit design; thermal runaway; thermal simulation; Integrated circuit modeling; Microwave FET integrated circuits; Microwave amplifiers; Microwave transistors; Micrwave integrated circuits; Radio frequency; Solid modeling; Transistors;
  • fLanguage
    English
  • Journal_Title
    Microwave Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1527-3342
  • Type

    jour

  • DOI
    10.1109/MMM.2012.2216691
  • Filename
    6355786