DocumentCode
1337148
Title
An Integrated Electrothermal Design Primer Using an SiGe HBT PA [Application Notes]
Author
Heimlich, Michael ; Schwitter, Bryan ; Ritchie, Graeme ; Fiala, John ; Mahon, Simon
Author_Institution
Macquarie Univ., Sydney, NSW, Australia
Volume
13
Issue
7
fYear
2012
Firstpage
70
Lastpage
80
Abstract
The integrated design flow that links simulation, layout, and electromagnetic (EM) analysis is the foundation for modern RF/microwave integrated circuit (IC) design. The inclusion of thermal simulation in this flow is now possible with modern thermal solvers linked into RF/microwave integrated design tools. Silicon germanium (SiGe) heterojunction bipolar transistor (HBT) power amplifier (PA) design is used as an example where such a flow is most beneficial due to numerous issues such as array sizing and thermal runaway. An electrothermal flow is discussed relative to some overall metrics for design flows and that incorporates the availability of an integrated thermal solver into the earliest parts of, and potentially throughout, the entire design flow. The result is a flow that potentially reduces iterations during the design process and boosts design performance by freeing up margin.
Keywords
bipolar integrated circuits; heterojunction bipolar transistors; integrated circuit layout; integrated circuit modelling; integrated circuit packaging; microwave integrated circuits; microwave power amplifiers; thermal analysis; thermal management (packaging); RF integrated circuit design; SiGe; array sizing; electromagnetic analysis; electrothermal flow; heterojunction bipolar transistor power amplifier; integrated circuit layout; integrated circuit simulation; integrated electrothermal design primer; microwave integrated circuit design; thermal runaway; thermal simulation; Integrated circuit modeling; Microwave FET integrated circuits; Microwave amplifiers; Microwave transistors; Micrwave integrated circuits; Radio frequency; Solid modeling; Transistors;
fLanguage
English
Journal_Title
Microwave Magazine, IEEE
Publisher
ieee
ISSN
1527-3342
Type
jour
DOI
10.1109/MMM.2012.2216691
Filename
6355786
Link To Document