• DocumentCode
    1337561
  • Title

    Comparison of the noise performance of 10 GHz repetition rate quantum-dot and quantum well monolithic mode-locked semiconductor lasers

  • Author

    Carpintero, Guillermo ; Thompson, Mark G. ; Yvind, Kresten ; Penty, Richard V. ; White, Ian H.

  • Author_Institution
    Dept. de Tecnol. Electron., Univ. Carlos III de Madrid, Leganés, Spain
  • Volume
    5
  • Issue
    5
  • fYear
    2011
  • fDate
    10/1/2011 12:00:00 AM
  • Firstpage
    195
  • Lastpage
    201
  • Abstract
    Mode-locked lasers are commonly used in carrier-wave signal generation systems because of their excellent phase noise performance. Owing to the importance of this key parameter, this study presents a like-for-like comparison of the noise performance of the passive mode-locked regime of two devices fabricated with different material gain systems, one quantum well and the other quantum dot (QD), both with a monolithic all-active two-section mode-locked structure. Two important factors are identified as having a significant effect on the noise performance, the RF linewidth of the first harmonic and the shape of the noise pedestals, both depending on the passive mode-locked bias conditions. Nevertheless, the dominant contribution of the RF linewidth to the phase noise, which is significantly narrower for the QD laser, makes this material more suitable for optical generation of low-noise millimetre-wave carrier frequencies.
  • Keywords
    laser mode locking; laser noise; optical pulse generation; phase noise; quantum dot lasers; quantum well lasers; RF linewidth; carrier-wave signal generation systems; frequency 10 GHz; low-noise millimetre-wave carrier frequencies; material gain systems; monolithic all-active two-section mode-locked structure; monolithic mode-locked semiconductor lasers; noise pedestals; optical generation; phase noise performance; pulse repetition rate; quantum well lasers; quantum-dot lasers;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IET
  • Publisher
    iet
  • ISSN
    1751-8768
  • Type

    jour

  • DOI
    10.1049/iet-opt.2010.0058
  • Filename
    6032133