Title :
Interpretation of Tm and T* in Relaxor Ferroelectric 0.93Pb(Zn1/3Nb2/3)O3-0.07PbTiO3
Author :
Tsukada, Shinya ; Terado, Yoshihiro ; Moriyoshi, Chikako ; Kuroiwa, Yoshihiro ; Kojima, Seiji
Author_Institution :
Grad. Sch. of Pure & Appl. Sci., Univ. of Tsukuba, Tsukuba, Japan
fDate :
10/1/2010 12:00:00 AM
Abstract :
The dielectric property of relaxor ferroelectric 0.93Pb(Zn1/3Nb2/3)O3-0.07PbTiO3 single crystals (PZN-0.07PT) is studied to investigate the ferroelectric phase transition. The temperature dependence of the susceptibility of the central peak in the light scattering shows a very similar behavior to the real part of the dielectric constant, indicating that the diffuse peak in the temperature dependence of the dielectric constant is induced by relaxation of the polarization. We suggest that the origin of the relaxation above Tm is the non-180° polarization flipping of a small polar nanoregion (PNR). Additionally, the behavior of the PNRs is interpreted through both the Brillouin spectra and high-energy synchrotron-radiation powder diffraction patterns. Our results reveal that T*~ 499K is the temperature below which the growth rate of the dynamic polarization fluctuation is suppressed by the additional random electric field induced by the generation of the static PNRs.
Keywords :
Brillouin spectra; dielectric polarisation; dielectric relaxation; ferroelectric transitions; lead compounds; permittivity; relaxor ferroelectrics; synchrotron radiation; Brillouin spectra; Pb(Zn0.33Nb0.67)O3-PbTiO3; dielectric constant; dielectric property; dielectric relaxation; diffuse peak; dynamic polarization fluctuation; ferroelectric phase transition; high-energy synchrotron-radiation powder diffraction patterns; light scattering; polar nanoregion; polarization flipping; random electric field; relaxor ferroelectric single crystals; susceptibility; Acoustics; Art; Fluctuations; Light scattering; Phonons; Relaxor ferroelectrics; Temperature measurement;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2010.1673