Title :
On the issues of oscillation test methodology
Author :
Wong, Mike Wai-Tak
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech., Kowloon, Hong Kong
fDate :
4/1/2000 12:00:00 AM
Abstract :
In recent years, advances in integration fabrication technologies prompted IC designers to move more analog circuitry onto what had been entirely digital chips, making the verification problem for the entire chip more difficult. This paper presents a detailed case study of using the oscillation test methodology to test an active low pass filter. We highlight some of the difficulties and shortcomings of this testing approach
Keywords :
active filters; analogue circuits; circuit oscillations; fault location; integrated circuit testing; low-pass filters; mixed analogue-digital integrated circuits; operational amplifiers; IC design; Ring configuration; active low pass filter; analog circuitry; digital chips; integration fabrication; oscillation test; verification; Analog circuits; Analog integrated circuits; Automatic testing; Circuit simulation; Circuit testing; Drives; Fabrication; Frequency response; Low pass filters; Operational amplifiers;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
