DocumentCode
1337694
Title
On the issues of oscillation test methodology
Author
Wong, Mike Wai-Tak
Author_Institution
Dept. of Electron. & Inf. Eng., Hong Kong Polytech., Kowloon, Hong Kong
Volume
49
Issue
2
fYear
2000
fDate
4/1/2000 12:00:00 AM
Firstpage
240
Lastpage
245
Abstract
In recent years, advances in integration fabrication technologies prompted IC designers to move more analog circuitry onto what had been entirely digital chips, making the verification problem for the entire chip more difficult. This paper presents a detailed case study of using the oscillation test methodology to test an active low pass filter. We highlight some of the difficulties and shortcomings of this testing approach
Keywords
active filters; analogue circuits; circuit oscillations; fault location; integrated circuit testing; low-pass filters; mixed analogue-digital integrated circuits; operational amplifiers; IC design; Ring configuration; active low pass filter; analog circuitry; digital chips; integration fabrication; oscillation test; verification; Analog circuits; Analog integrated circuits; Automatic testing; Circuit simulation; Circuit testing; Drives; Fabrication; Frequency response; Low pass filters; Operational amplifiers;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.843056
Filename
843056
Link To Document