DocumentCode :
1337703
Title :
Reactive power measurement using the wavelet transform
Author :
Yoon, Weon-Ki ; Devaney, Michael J.
Author_Institution :
Digital Power Instrum. Group, Missouri Univ., Columbia, MO, USA
Volume :
49
Issue :
2
fYear :
2000
fDate :
4/1/2000 12:00:00 AM
Firstpage :
246
Lastpage :
252
Abstract :
This paper provides the theoretical basis for the measurement of reactive and distortion powers from the wavelet transforms. The measurement of reactive power relies on the use of broad-band phase-shift networks to create concurrent in-phase currents and quadrature voltages. The wavelet real power computation resulting from these 90° phase-shift networks yields the reactive power associated with each wavelet frequency level or subband. The distortion power at each wavelet subband is then derived from the real, reactive and apparent powers of the subband, where the apparent power is the product of the v, i element pair´s subband rms voltage and current. The advantage of viewing the real and reactive powers. In the wavelet domain is that the domain preserves both the frequency and time relationship of these powers. In addition, the reactive power associated with each wavelet subband is a signed quantity and thus has a direction associated with it. This permits tracking the reactive power flow in each subband through the power system
Keywords :
phase shifters; power measurement; reactive power; signal processing; wavelet transforms; RMS; apparent power; broad-band phase-shift networks; concurrent in-phase currents; digital signal processing; distortion power; energy flow analysis; equal ripple method; maximally flat quadrature; quadrature voltage; reactive power measurement; wavelet frequency level; wavelet real power computation; wavelet transform; Computer networks; Current measurement; Distortion measurement; Frequency; Phase measurement; Power measurement; Reactive power; Voltage; Wavelet domain; Wavelet transforms;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.843057
Filename :
843057
Link To Document :
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