• DocumentCode
    1337750
  • Title

    Low temperature bonding of epitaxial lift off devices with AuSn

  • Author

    Dohle, G. Rainer ; Drabik, Timothy J. ; Callahan, John J. ; Martin, Kevin P.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    19
  • Issue
    3
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    575
  • Lastpage
    580
  • Abstract
    The increasing demand for more advanced optoelectronic integrated circuits has created the need for bonding materials with different lattice constants (for example, GaAs on Si). In this paper, we report a new way for the bonding of epitaxial lift off (ELO) devices onto substrates. The multilayer structures investigated in this work produce a resulting AuSn alloy with approximately 84 wt.% gold, but can be bonded with a peak temperature of 235°C. The bonded samples were investigated with several standard surface analysis techniques like optical microscopy, scanning electron microscopy (SEM), and energy dispersive X-ray analysis (EDX) as well as mechanical tests. The results of our research allowed us to optimize the layer structure, the bonding parameters as well as the diffusion barriers
  • Keywords
    X-ray chemical analysis; diffusion barriers; gold alloys; integrated optoelectronics; lattice constants; optical microscopy; scanning electron microscopy; tin alloys; wafer bonding; 235 degC; AuSn; ELO devices; bonding materials; bonding parameters; diffusion barriers; energy dispersive X-ray analysis; epitaxial lift off devices; lattice constants; low temperature bonding; mechanical tests; multilayer structures; optical microscopy; optoelectronic integrated circuits; peak temperature; scanning electron microscopy; surface analysis techniques; Bonding; Electron optics; Gallium arsenide; Gold alloys; Lattices; Nonhomogeneous media; Optical microscopy; Scanning electron microscopy; Substrates; Temperature;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.533898
  • Filename
    533898