Title :
Broadband versus stepped sine FRF measurements
Author :
Schoukens, Johan ; Pintelon, Rik M. ; Rolain, Yves J.
Author_Institution :
Dept. ELEC, Vrije Univ., Brussels, Belgium
fDate :
4/1/2000 12:00:00 AM
Abstract :
In this paper, the required measurement time to measure a transfer function with a specified accuracy is analyzed. The waiting time that is needed to balance the transient induced errors against the noise errors is calculated. This allows one to decide under what conditions broad-band measurements are faster than stepped sine measurements
Keywords :
circuit noise; discrete time systems; network analysis; random processes; spectral analysis; transfer functions; transients; accuracy; band-pass filter; broad-band measurements; frequency response function; measurement time; noise errors; stepped sine FRF measurements; transfer function; waiting time; Discrete Fourier transforms; Fast Fourier transforms; Filters; Frequency conversion; Frequency measurement; Frequency response; Noise measurement; Signal to noise ratio; Time measurement; Transfer functions;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
