• DocumentCode
    1337757
  • Title

    Dielectric properties of rutile structure (Zn1/3B2/3)x(TiySn1ߝy)1ߝxO2 (B=Nb5+,Ta5+) at microwave frequencies

  • Author

    Kim, Eung Soo ; Seo, Seock No

  • Author_Institution
    Dept. of Mater. Eng., Kyonggi Univ., Suwon, South Korea
  • Volume
    57
  • Issue
    10
  • fYear
    2010
  • fDate
    10/1/2010 12:00:00 AM
  • Firstpage
    2250
  • Lastpage
    2256
  • Abstract
    The microwave dielectric properties of rutile (Zn1/3B2/3)x(TiySn1-y)1-xO2 (B = Nb5+, Ta5+, 0.05 ≤ × ≤ 0.35, y = 0.2, 0.8) were investigated with structural characteristics. A single phase with tetragonal rutile (P42/mnm, no. 136, Z = 2) structure was obtained through the entire range of compositions. With an increase of (Zn1/3B2/3)O2 content, the dielectric constant (K) of sintered specimens with (Ti0.2Sn0.8)O2 increased, whereas that of the specimens with (Ti0.8Sn0.2)O2 decreased. The temperature coefficient of resonant frequency (TCF) of sintered specimens was dependent upon oxygen octahedral distortion and/or cations bond valence of the rutile structure. The quality factor (Qf) was dependent upon (Zn1/3B2/3)O2 content, and the specimens with (Ti0.2Sn0.8)O2 showed larger Qf values than those with (Ti0.8Sn0.2)O2 for the same content of (Zn1/3B2/3)O2.
  • Keywords
    Q-factor; crystal structure; dielectric resonance; niobium compounds; permittivity; tantalum compounds; titanium compounds; valency; zinc compounds; (Zn0.33Nb0.67)x(TiySn1-y)1-xO2; (Zn0.33Ta0.67)x(TiySn1-y)1-xO2; cation bond valence; crystal structure; dielectric constant; microwave dielectric properties; oxygen octahedral distortion; quality factor; resonant frequency temperature coefficient; rutile structure; single phase; tetragonal rutile structure; Crystals; Dielectric constant; Ions; Powders; Temperature; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2010.1686
  • Filename
    5587407