DocumentCode :
1337848
Title :
Enhanced Current Drivability of CVD Graphene Interconnect in Oxygen-Deficient Environment
Author :
Kang, Chang Goo ; Lee, Sang Kyung ; Lee, Young Gon ; Hwang, Hyeon Jun ; Cho, Chunhum ; Lim, Sung Kwan ; Heo, Jinseong ; Chung, Hyun-Jong ; Yang, Heejun ; Seo, Sunae ; Lee, Byoung Hun
Author_Institution :
Sch. of Mater. Sci. & Eng., Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
Volume :
32
Issue :
11
fYear :
2011
Firstpage :
1591
Lastpage :
1593
Abstract :
Graphene has been considered as a candidate for interconnect metal due to its high carrier mobility and current drivability. In this letter, the breakdown mechanism of single-layer chemical-vapor-deposited (CVD) graphene and triple-layer CVD graphene has been investigated at three different conditions (air exposed, vacuum, and dielectric capped) to identify a failure mechanism. In vacuum, both single- and triple-layer graphenes demonstrated a breakdown current density as high as ~108 A/cm2, which is similar to that of exfoliated graphene. On the other hand, the breakdown current of graphene exposed to air was degraded by one order of magnitude from that of graphene tested in vacuum. Thus, oxidation initiated at the defect sites of CVD graphene was suggested as a major failure mechanism in air, while Joule heating was more dominant with dielectric capping and in vacuum.
Keywords :
chemical vapour deposition; current density; electric breakdown; graphene; integrated circuit interconnections; oxidation; C; CVD graphene interconnect; Joule heating; breakdown current density; breakdown mechanism; carrier mobility; chemical vapor deposition; current drivability; dielectric capping; failure mechanism; oxygen-deficient environment; single-layer graphene; triple-layer graphene; Aluminum oxide; Conductivity; Copper; Current density; Heating; Vacuum breakdown; Breakdown; current density; failure mechanism; graphene; interconnect;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2166240
Filename :
6032709
Link To Document :
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