A high-temperature electronic system for pressure-transducers

Author

de Jong, Paul C. ; Meijer, Gerard C M

Author_Institution

Fac. of Electr. Eng., Delft Univ. of Technol., Netherlands

Volume

49

Issue

2

fYear

2000

fDate

4/1/2000 12:00:00 AM

Firstpage

365

Lastpage

370

Abstract

This paper describes a high-temperature pressure-transducer interface for resistive Wheatstone bridges. The long-term drift of the smart sensor, i.e., the (pressure) sensor plus its interface electronics, will be determined by the drift of the sensor element only. A three-signal auto-calibration sequence of the interface electronics keeps the transducer interface virtually free of long-term drift. A novel low-drift preamplifier forms an essential element in this system. The high-temperature operation of the transducer interface has been investigated from both an electronic and a packaging point of view. The system has been realized by combining CMOS ASICs with a thick-film packaging technology. The pressure-transducer interface works up to 250-275°C with 15-16 bits accuracy

Keywords

CMOS integrated circuits; application specific integrated circuits; bridge circuits; calibration; feedback amplifiers; high-temperature electronics; instrumentation amplifiers; integrated circuit packaging; intelligent sensors; lead bonding; preamplifiers; pressure transducers; thermal management (packaging); 250 to 275 C; CMOS ASIC; die bonding; dynamic element matching; dynamic feedback instrumentation amplifier; electromigration problems; high-temperature electronic system; high-temperature pressure-transducer interface; hybrid packaging; interface electronics; leakage currents; long-term drift; low-drift preamplifier; resistive Wheatstone bridges; smart sensor; temperature-resistant package; thick-film packaging technology; three-signal auto-calibration sequence; wire bonding; Bridge circuits; CMOS technology; Circuit stability; Electronics packaging; Intelligent sensors; Pressure gauges; Space technology; Temperature sensors; Transducers; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.843079

Filename

843079