Title :
Low-cost electrochemical impedance spectroscopy system for corrosion monitoring of metallic antiquities and works of art
Author :
Carullo, Alessio ; Ferraris, Franco ; Parvis, Marco ; Vallan, Alberto ; Angelini, Emma ; Spinelli, Paolo
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
fDate :
4/1/2000 12:00:00 AM
Abstract :
Electrochemical impedance spectroscopy (EIS) is recognized to be a powerful and noninvasive technique to test the integrity of protective coatings on memorials, but commercial EIS systems are rather costly though versatile devices. This paper describes a low cost and portable EIS system that is based on a compact digital signal processor (DSP) board and embeds the potentiostatic function so that it can be used without requiring an external potentiostat. The software that runs on the DSP is designed to analyze the electrochemical impedance only in a reduced frequency range in order to produce a simple corrosion alert result. The device is equipped with a digital interface and can be connected to a personal computer to carry out a complete frequency analysis and perform a more complex data processing
Keywords :
archaeology; art; cells (electric); computerised instrumentation; corrosion protective coatings; corrosion testing; digital signal processing chips; electric impedance measurement; electrochemistry; portable instruments; DAC; analog interface circuit; compact DSP board; complete frequency analysis; corrosion monitoring; digital interface; electrochemical impedance spectroscopy; embedded potentiostatic function; floating point processor; intelligent systems; low-cost system; metallic antiquities; noninvasive technique; portable system; programmable ADC; protective coating integrity; reduced frequency range; time-domain algorithm; works of art; Coatings; Corrosion; Cost function; Digital signal processing; Digital signal processors; Electrochemical impedance spectroscopy; Frequency; Noninvasive treatment; Power system protection; System testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on