• DocumentCode
    1337897
  • Title

    Numerical stress analysis of resin cracking in LSI plastic packages under temperature cyclic loading

  • Author

    Saitoh, Takehiro

  • Author_Institution
    NEC Corp., Kanagawa, Japan
  • Volume
    19
  • Issue
    3
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    593
  • Lastpage
    600
  • Abstract
    Numerical stress analysis of resin cracking occurring in plastic packages during temperature cyclic loading was carried out using a thermoelastic finite-element method (FEM) for the nonlinear contact problem. Through the use of the linear fracture mechanics approach to the bimaterial problem, the analysis provides a fracture parameter and indicates the direction in which resin cracking occurs. Temperature cycling tests using actual plastic packages were also performed to verify the validity of the analysis results experimentally. It was found that the test results agreed well with the analytical results. It was also clear that the delamination occurring between dissimilar materials determines the degree to which resin cracking occurs quantitatively and the most harmful delamination occurs in the die bonding layer. The resin cracking mechanism was studied and a countermeasure against it was proposed
  • Keywords
    delamination; finite element analysis; fracture mechanics; integrated circuit packaging; large scale integration; plastic packaging; stress analysis; thermal stress cracking; LSI plastic packages; bimaterial problem; delamination; die bonding layer; fracture parameter; linear fracture mechanics; nonlinear contact problem; numerical stress analysis; resin cracking; temperature cyclic loading; temperature cycling tests; thermoelastic finite-element method; Delamination; Finite element methods; Large scale integration; Performance evaluation; Plastic packaging; Resins; Temperature; Testing; Thermal stresses; Thermoelasticity;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.533901
  • Filename
    533901