Title :
The sensitivity of a method to predict a capacitor´s frequency characteristic
Author :
Avramov-Zamurovic, Svetlana ; Koffman, Andrew D. ; Oldham, Nile M. ; Waltrip, Bryan Christopher
Author_Institution :
US Naval Acad., Annapolis, MD, USA
fDate :
4/1/2000 12:00:00 AM
Abstract :
A joint effort between the US Naval Academy and the NIST resulted in the development of a method to characterize the capacitance and dissipation factor of a set of commercial standard four terminal-pair (4TP) capacitors. The method depends on network analyzer impedance measurements at high frequencies (40-200 MHz) and a regression of these measurements down to the frequency range of 10 MHz-1 kHz. This paper provides an analysis of the sensitivity of the regression parameters and the high-frequency impedance measurements
Keywords :
calibration; capacitance measurement; capacitors; electric impedance measurement; measurement standards; network analysers; sensitivity analysis; 10 MHz to 1 kHz; 40 to 200 MHz; calibration; capacitance standards; dissipation factor; exponent parameter variation; frequency characteristic prediction; high-frequency impedance measurements; network analyzer impedance measurements; offset errors reduction; precision measurement; regression parameters; sensitivity; standard four terminal-pair capacitors; Capacitance measurement; Capacitors; Equations; Frequency measurement; Impedance measurement; Laboratories; NIST; Performance evaluation; Sensitivity analysis; Standards development;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
