DocumentCode :
1338015
Title :
Highly Manufacturable Device Isolation Technology Using Laser-Induced Epitaxial Growth for Monolithic Stack Devices
Author :
Son, Yong-Hoon ; Baik, Seung Jae ; Jeon, Sanghun ; Lee, Jong-Wook ; Hwang, Gihyun ; Shin, Yoo Gyun ; Yoon, Euijoon
Author_Institution :
Semicond. R&D Center, Samsung Electron. Co., Ltd., Yongin, South Korea
Volume :
58
Issue :
11
fYear :
2011
Firstpage :
3863
Lastpage :
3868
Abstract :
A novel isolation technology using a laser-induced epitaxial growth (LEG) process is proposed to achieve monolithically stacked active silicon without additional thermal budget. The epitaxial behavior in the proposed LEG process can be completely understood by existing models regarding solidification of melted Si. Test devices for electrical characterization were fabricated based on an established 80-nm dynamic random access memory (DRAM) process. The characteristics of DRAM cell transistors with this LEG-processed active silicon are shown to be similar to those with conventional active silicon in terms of both device performances and distributions. Therefore, LEG process is believed to be a promising device isolation technology for monolithic multistack devices.
Keywords :
DRAM chips; epitaxial growth; monolithic integrated circuits; DRAM cell transistors; dynamic random access memory process; electrical characterization; laser-induced epitaxial growth process; manufacturable device isolation technology; melted silicon solidification; monolithic multistack device; monolithically stacked active silicon; size 80 nm; test devices; Epitaxial growth; Laser beams; Random access memory; Silicon; Substrates; Transistors; Epitaxial growth; laser recrystallization; monolithic stack devices; shallow trench isolation (STI);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2167333
Filename :
6032734
Link To Document :
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