DocumentCode
1338015
Title
Highly Manufacturable Device Isolation Technology Using Laser-Induced Epitaxial Growth for Monolithic Stack Devices
Author
Son, Yong-Hoon ; Baik, Seung Jae ; Jeon, Sanghun ; Lee, Jong-Wook ; Hwang, Gihyun ; Shin, Yoo Gyun ; Yoon, Euijoon
Author_Institution
Semicond. R&D Center, Samsung Electron. Co., Ltd., Yongin, South Korea
Volume
58
Issue
11
fYear
2011
Firstpage
3863
Lastpage
3868
Abstract
A novel isolation technology using a laser-induced epitaxial growth (LEG) process is proposed to achieve monolithically stacked active silicon without additional thermal budget. The epitaxial behavior in the proposed LEG process can be completely understood by existing models regarding solidification of melted Si. Test devices for electrical characterization were fabricated based on an established 80-nm dynamic random access memory (DRAM) process. The characteristics of DRAM cell transistors with this LEG-processed active silicon are shown to be similar to those with conventional active silicon in terms of both device performances and distributions. Therefore, LEG process is believed to be a promising device isolation technology for monolithic multistack devices.
Keywords
DRAM chips; epitaxial growth; monolithic integrated circuits; DRAM cell transistors; dynamic random access memory process; electrical characterization; laser-induced epitaxial growth process; manufacturable device isolation technology; melted silicon solidification; monolithic multistack device; monolithically stacked active silicon; size 80 nm; test devices; Epitaxial growth; Laser beams; Random access memory; Silicon; Substrates; Transistors; Epitaxial growth; laser recrystallization; monolithic stack devices; shallow trench isolation (STI);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2011.2167333
Filename
6032734
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