Analysis of microstrip lines in multilayer structures of arbitrarily varying thickness

Author

Dreher, Achim ; Ioffe, Alexander

Author_Institution

Inst. of Radio Frequency Technol., German Aerosp. Center, Wessling, Germany

Volume

10

Issue

2

fYear

2000

Firstpage

52

Lastpage

54

Abstract

A general approach to the full-wave analysis of microstrip lines in multilayer dielectrics of arbitrarily varying thickness is developed. It is based on the discrete mode matching technique (DMM) and uses a full-wave equivalent circuit for the stratified structure, which is simple to apply in a numerical procedure, As an example, the propagation constant of a microstrip line in the interface of two dielectrics as a function of different shape characteristics is computed.

Keywords

Helmholtz equations; equivalent circuits; microstrip antennas; microstrip lines; mode matching; arbitrarily varying thickness; discrete mode matching technique; full-wave analysis; full-wave equivalent circuit; microstrip lines; multilayer structures; propagation constant; shape characteristics; stratified structure; Boundary conditions; Dielectrics; Finite difference methods; Metallization; Microstrip; Nonhomogeneous media; Partial differential equations; Propagation constant; Sampling methods; Shape;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.843098

Filename

843098