Title :
Analysis of microstrip lines in multilayer structures of arbitrarily varying thickness
Author :
Dreher, Achim ; Ioffe, Alexander
Author_Institution :
Inst. of Radio Frequency Technol., German Aerosp. Center, Wessling, Germany
Abstract :
A general approach to the full-wave analysis of microstrip lines in multilayer dielectrics of arbitrarily varying thickness is developed. It is based on the discrete mode matching technique (DMM) and uses a full-wave equivalent circuit for the stratified structure, which is simple to apply in a numerical procedure, As an example, the propagation constant of a microstrip line in the interface of two dielectrics as a function of different shape characteristics is computed.
Keywords :
Helmholtz equations; equivalent circuits; microstrip antennas; microstrip lines; mode matching; arbitrarily varying thickness; discrete mode matching technique; full-wave analysis; full-wave equivalent circuit; microstrip lines; multilayer structures; propagation constant; shape characteristics; stratified structure; Boundary conditions; Dielectrics; Finite difference methods; Metallization; Microstrip; Nonhomogeneous media; Partial differential equations; Propagation constant; Sampling methods; Shape;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
