DocumentCode :
133819
Title :
MRI brain cancer classification using Support Vector Machine
Author :
Nandpuru, Hari Babu ; Salankar, S.S. ; Bora, V.R.
Author_Institution :
Electron. & Commun. Eng., RTMN Univ., Nagpur, India
fYear :
2014
fDate :
1-2 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
This research paper proposes an intelligent classification technique to recognize normal and abnormal MRI brain image. Medical image like ECG, MRI and CT-scan images are important way to diagnose disease of human being efficiently. The manual analysis of tumor based on visual inspection by radiologist/physician is the conventional method, which may lead to wrong classification when a large number of MRIs are to be analyzed. To avoid the human error, an automated intelligent classification system is proposed which caters the need for classification of image. One of the major causes of death among people is Brain tumor. The chances of survival can be increased if the tumor is detected correctly at its early stage. Magnetic resonance imaging (MRI) technique is used for the study of the human brain. In this research work, classification techniques based on Support Vector Machines (SVM) are proposed and applied to brain image classification. In this paper feature extraction from MRI Images will be carried out by gray scale, symmetrical and texture features. The main objective of this paper is to give an excellent outcome (i.e. higher accuracy rate and lower error rate) of MRI brain cancer classification using SVM.
Keywords :
biomedical MRI; brain; cancer; computerised tomography; electrocardiography; feature extraction; image classification; image texture; medical disorders; medical image processing; neurophysiology; support vector machines; CT-scan imaging; ECG imaging; MRI brain cancer classification; MRI brain imaging; MRI technique; SVM; automated intelligent classification system; brain image classification; brain tumor; disease diagnosis; feature extraction; gray scale; intelligent classification technique; magnetic resonance imaging technique; support vector machine; visual inspection; Artificial neural networks; Bayes methods; Databases; Educational institutions; Magnetic resonance imaging; Support vector machines; Testing; Classification; MRI; PCA; SVM; Skull masking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical, Electronics and Computer Science (SCEECS), 2014 IEEE Students' Conference on
Conference_Location :
Bhopal
Print_ISBN :
978-1-4799-2525-4
Type :
conf
DOI :
10.1109/SCEECS.2014.6804439
Filename :
6804439
Link To Document :
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