DocumentCode :
1338236
Title :
Best short rate 1/2 tailbiting codes for the bit-error rate criterion
Author :
Anderson, John B.
Author_Institution :
Inf. Technol. Dept., Lund Univ., Sweden
Volume :
48
Issue :
4
fYear :
2000
fDate :
4/1/2000 12:00:00 AM
Firstpage :
597
Lastpage :
610
Abstract :
We give a method of finding convolutional codes with minimum bit-error rate (BER) that combines ideas of importance sampling, Monte Carlo integration, and maximum a posteriori probability decoding. The method is applied to rate 1/2 tailbiting convolutional coding, both feedforward and feedback systematic. Tables of BER-minimizing encoders are given for memories 2-5 and tailbiting size 5-40, over a range of good and bad binary symmetric and additive white Gaussian noise channels. The best generators for these cases are in general all different and are not necessarily the generators that optimize distance. The best generators for bad channels are always systematic. The best when the channel quality is known are usually feedforward, but when it is unknown, they are feedback systematic. The best generators in good channels are predicted by a union bound technique
Keywords :
AWGN channels; Monte Carlo methods; convolutional codes; error statistics; feedback; feedforward; importance sampling; maximum likelihood decoding; AWGN channel; BER criterion; Monte Carlo integration; a posteriori probability trellis decoding; additive white Gaussian noise channel; bad channels; best short rate 1/2 tailbiting codes; binary symmetric channels; bit-error rate; channel quality; convolutional codes; feedback systematic codes; feedforward systematic codes; good channels; importance sampling; maximum a posteriori probability decoding; maximum likelihood decoder; minimum bit-error rate; union bound technique; Additive white noise; Bit error rate; Communications Society; Convolutional codes; Decoding; Error correction codes; Feedback; Monte Carlo methods; Testing; Viterbi algorithm;
fLanguage :
English
Journal_Title :
Communications, IEEE Transactions on
Publisher :
ieee
ISSN :
0090-6778
Type :
jour
DOI :
10.1109/26.843127
Filename :
843127
Link To Document :
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